• DocumentCode
    3477345
  • Title

    Illumination invariant and rotational insensitive textural representation

  • Author

    Vácha, Pavel ; Haindl, Michal

  • Author_Institution
    Inst. of Inf. Theor. & Autom. of the ASCR, Prague, Czech Republic
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    1333
  • Lastpage
    1336
  • Abstract
    We propose an illumination invariant and rotation insensitive texture representation based on a Markovian textural model. A texture is aligned with its dominant orientation and textural features are derived from fast analytical estimates of Markovian statistics. We do not require any knowledge of illumination direction or spectrum. This makes our method suitable for computer analysis of real scenes, where appearance of materials depends on their orientation towards the illumination source. Our method is tested on the most realistic visual representation of natural materials - the bidirectional texture function (BTF), using data from the CUReT database, where it outperforms the alternative leading illumination invariant Local Binary Patterns (LBP) and texton MR8 methods, respectively.
  • Keywords
    Markov processes; image texture; statistical analysis; CUReT database; Markovian statistics; Markovian textural model; bidirectional texture function; computer analysis; dominant orientation; illumination direction; illumination invariant textural representation; illumination source; local binary patterns; natural materials; rotational insensitive textural representation; texton MR8 methods; textural features; visual representation; Algorithm design and analysis; Automation; Histograms; Information theory; Layout; Lighting; Markov random fields; Rough surfaces; Spatial databases; Surface roughness; Illumination invariance; Markov random fields; texture features;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5413578
  • Filename
    5413578