• DocumentCode
    3477447
  • Title

    A study of the internal and external effects of concurrency bugs

  • Author

    Fonseca, Pedro ; Li, Cheng ; Singhal, Vishal ; Rodrigues, Rodrigo

  • Author_Institution
    Max Planck Inst. for Software Syst. (MPI-SWS), Germany
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    221
  • Lastpage
    230
  • Abstract
    Concurrent programming is increasingly important for achieving performance gains in the multi-core era, but it is also a difficult and error-prone task. Concurrency bugs are particularly difficult to avoid and diagnose, and therefore in order to improve methods for handling such bugs, we need a better understanding of their characteristics. In this paper we present a study of concurrency bugs in MySQL, a widely used database server. While previous studies of real-world concurrency bugs exist, they have centered their attention on the causes of these bugs. In this paper we provide a complementary focus on their effects, which is important for understanding how to detect or tolerate such bugs at run-time. Our study uncovered several interesting facts, such as the existence of a significant number of latent concurrency bugs, which silently corrupt data structures and are exposed to the user potentially much later. We also highlight several implications of our findings for the design of reliable concurrent systems.
  • Keywords
    SQL; multiprocessing programs; parallel programming; program debugging; MySQL; concurrency bug; concurrent programming; data structure; database server; error prone task; multicore era; Computer bugs; Concurrent computing; Fault detection; Interleaved codes; Manufacturing processes; Performance gain; Programming profession; Software performance; Software systems; Yarn;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544315
  • Filename
    5544315