DocumentCode
3477536
Title
Thermosonic ball bonding behavior and reliability study of Ag alloy wire
Author
Kumar, Sudhakar ; Hoontae Kwon ; Young Il Heo ; Seung Hyun Kim ; June Sub Hwang ; Jeong Tak Moon
Author_Institution
MK Electron Co. Ltd., Yongin, South Korea
fYear
2013
fDate
11-14 Aug. 2013
Firstpage
254
Lastpage
259
Abstract
Recently Silver (Ag) wire has drawn attention to the packaging industry because of the bonding quality and long term reliability concerns with the Cu and Pd coated wire. Ag wire has low cost, high thermal and electrical conductivity as compared to Au while their mechanical properties such as hardness, elongation and breaking load are similar to Au. In the present study, free air ball (FAB) formation, bonding behavior and reliability of Ag alloy wire (Ag-Au-Pd) bonding was studied. The careful control of electronic flame off (EFO) current, time and gas flow rate leads to spherical FAB ball formation without defects. The Ag alloy wire delivers good and stable bonding capability using nitrogen as ambient gas. Both the bonded ball and stich bonding show good bond integrity. The reliability is determined by the high temperature storage life test (HTSL) test. Intermetallic compound (IMC) growth behavior during reliability test is characterized by the scanning electron microscopy (SEM) and energy dispersive spectrometer analyses (EDS). Two types of IMCs Ag2Al and Ag3Al were observed. The Ag alloy wire show floor life time of minimum 10 weeks based on bonded ball shape, workability and bondability test.
Keywords
integrated circuit reliability; life testing; scanning electron microscopy; silver; tape automated bonding; Ag; EDS; SEM; alloy wire; bond integrity; bondability test; bonded ball shape; bonding quality; breaking load; electrical conductivity; electronic flame off current; elongation; energy dispersive spectrometer analyses; free air ball formation; gas flow rate; hardness; high temperature storage life test test; intermetallic compound growth behavior; mechanical properties; packaging industry; reliability test; scanning electron microscopy; silver wire; spherical FAB ball formation; stich bonding; thermal conductivity; thermosonic ball bonding behavior; Bonding; Conductivity; Gold; Reliability; Thermal conductivity; Wires; free air ball; reliability; silver alloy wire; wire bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location
Dalian
Type
conf
DOI
10.1109/ICEPT.2013.6756466
Filename
6756466
Link To Document