• DocumentCode
    3477616
  • Title

    Multi-frequency Test for analog circuits

  • Author

    Cheng Wang ; Ye Yun ; Hai-lang Liang ; Jin He ; Mansun Chan

  • Author_Institution
    Shenzhen SOC Key Lab., Peking Univ., Shenzhen, China
  • fYear
    2013
  • fDate
    3-5 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, multi-frequency test is presented, which can maximize differences between the failure state and the normal state of the analog circuit´s response. Using sensitivity analysis, the multi-frequency test vectors of the circuit under test(CUT) are generated and chosen. The experimental results show that this approach is very effective and highly practical for multi-frequency test vectors of the analog circuits.
  • Keywords
    analogue circuits; circuit testing; failure analysis; sensitivity analysis; CUT; analog circuit response; analog circuits multifrequency test; circuit under test; failure state; multifrequency test vectors; sensitivity analysis; Vectors; Analog Circuits; Multi-Frequency Test; Sensitivity Analysis; Test Vector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
  • Conference_Location
    Hong Kong
  • Type

    conf

  • DOI
    10.1109/EDSSC.2013.6628185
  • Filename
    6628185
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3477616