DocumentCode :
3477659
Title :
Measuring Area-Complexity Using Boolean Difference
Author :
Kagliwal, A. ; Balachandran, Shankar
Author_Institution :
Comput. Sci. & Eng. Dept., Indian Inst. of Technol. Madras, Chennai, India
fYear :
2013
fDate :
5-10 Jan. 2013
Firstpage :
245
Lastpage :
250
Abstract :
For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like literal count, number of primary input/outputs, etc. have been used in the past as area-complexity metrics. In this paper, we propose a novel area-complexity measure using the theory of Boolean difference and Taylor expansion for Boolean functions. We demonstrate how to capture the area-complexity of a Boolean function using the complexity of its Boolean derivatives. We evaluate the metric on circuits from MCNC benchmark suite and a sizeable collection of randomly generated circuits. We compare our metric with existing techniques based on literal-count and BDD properties. We show that the new area-complexity measure is accurate within 10% of the actual number of gates synthesized using ABC as opposed to at least 100% and 15% for the metrics based on literal-count and BDD properties respectively. We also show the robustness of our metric across three different gate-libraries.
Keywords :
Boolean functions; area measurement; circuit complexity; combinational circuits; logic design; ABC; BDD properties; Boolean derivatives; Boolean difference; Boolean functions; MCNC benchmark suite; Taylor expansion; area-complexity measurement; combinational circuit; gate synthesis; gate-libraries; literal-count-based techniques; logic area estimation; primary input-outputs; randomly generated circuits; Area measurement; Benchmark testing; Boolean functions; Complexity theory; Logic gates; Taylor series; Boolean difference; area-complexity; logic synthesis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and 2013 12th International Conference on Embedded Systems (VLSID), 2013 26th International Conference on
Conference_Location :
Pune
ISSN :
1063-9667
Print_ISBN :
978-1-4673-4639-9
Type :
conf
DOI :
10.1109/VLSID.2013.195
Filename :
6472647
Link To Document :
بازگشت