DocumentCode :
3477827
Title :
Comparison of zero degree and tilted arsenic MDD implants
Author :
Tripsas, Nicholas H. ; Nayak, Deepak ; Luning, Scott
Author_Institution :
Adv. Micro Devices Inc., Sunnyvale, CA, USA
fYear :
1996
fDate :
16-21 Jun 1996
Firstpage :
33
Lastpage :
36
Abstract :
N-type LDD´s are commonly formed using Phosphorus implants. Phosphorus has the advantage of easily forming graded junctions that are necessary for reducing hot carrier injection. However, as gate dimensions continue to decrease, short channel effects become excessive with Phosphorus. Arsenic has the advantage of lower diffusivity. This allows for higher doping levels while maintaining shallow junction depths; such structures are known as MDD´s. Replacing a zero degree Phosphorus implant with a zero degree Arsenic implant results in high field areas under gates. This increases hot carrier injection. Angled Arsenic implants with multiple twists spread junctions laterally. This reduces hot carrier injection while still retaining the other benefits of Arsenic
Keywords :
MOSFET; arsenic; hot carriers; ion implantation; semiconductor device reliability; 0.35 mum; Si:As; diffusivity; graded junctions; high doping levels; high field areas; hot carrier injection; lateral junction spread; medium doped drain; multiple twists; nMOS transistors; shallow junction depths; short channel effects; tilted As MDD implants; transistor parameters; zero degree As MDD implants; Degradation; Doping; Hot carrier injection; Human computer interaction; Implants; Testing; Transistors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology. Proceedings of the 11th International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3289-X
Type :
conf
DOI :
10.1109/IIT.1996.586107
Filename :
586107
Link To Document :
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