DocumentCode :
3478182
Title :
A novel technology mapping method for AND/XOR expressions
Author :
Ko, Seok-Bum ; Lo, Jien-Chung
Author_Institution :
Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask., Canada
fYear :
2003
fDate :
16-19 May 2003
Firstpage :
133
Lastpage :
138
Abstract :
In this paper we propose a novel technology mapping technique for Look-Up Table (LUT) - based Field Programmable Gate Arrays (FPGA). The proposed technology mapping technique is based on AND/exclusive-OR (XOR) expressions. The AND/XOR nature of the proposed techniques can map many important XOR-intensive applications, such as error detecting/correcting, data encryption/decryption, and computer arithmetic circuits efficiently in FPGA. The typical EDA tools deal mainly with AND/OR expressions and therefore are quite inefficient for XOR-intensive applications. We design a new approach and conduct experiments using MCNC benchmark circuits in FPGA environment to demonstrate the effectiveness of our proposed technology mapping technique. The proposed technique is superior to the typical methods with respect to area. When using the proposed technique, the number of CLB is reduced by 67.6% (speed-optimized one) and 57.7% (area-optimized one) and the total number of equivalent gate counts is also reduced by 65.5% compared to the typical methods.
Keywords :
benchmark testing; field programmable gate arrays; hardware description languages; table lookup; AND/exclusive-OR expressions; EDA tools; MCNC benchmark circuits; XOR-intensive applications; computer arithmetic circuits; data decryption; data encryption; error correction; error detection; field programmable gate arrays; hardware description languages; look-up table; Application software; Automatic testing; Boolean functions; Circuit synthesis; Circuit testing; Cryptography; Error correction; Field programmable gate arrays; Logic circuits; Table lookup;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multiple-Valued Logic, 2003. Proceedings. 33rd International Symposium on
ISSN :
0195-623X
Print_ISBN :
0-7695-1918-0
Type :
conf
DOI :
10.1109/ISMVL.2003.1201397
Filename :
1201397
Link To Document :
بازگشت