DocumentCode
3478294
Title
A digital blind background calibration algorithm for pipelined ADC
Author
Shengjing Li ; Weitao Li ; Fule Li ; Zhihua Wang ; Chun Zhang
Author_Institution
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear
2015
fDate
7-10 June 2015
Firstpage
1
Lastpage
4
Abstract
This work presents a blind background calibration algorithm for correcting inter-stage gain error and capacitor mismatches in pipelined ADC. Based on the analysis of the density of specific output codes, the algorithm stores the information of the codes and needs only 80 registers. And there is no need to modify the analog circuits, which simplifies the design. Besides, since there is no multiplication or division in the digital logic, the algorithm can be implemented with a low hardware overhead, which lowers the power dissipation. For verification, a 14-bit 150MS/s ADC is fabricated in 130nm CMOS process. At 15.5MHz input signal, SDNR/SFDR improved from 66.8dB/78.57dBc to 69.7dB/87.3dBc and INL dropped from 8LSB to 3LSB after calibration.
Keywords
CMOS logic circuits; analogue-digital conversion; calibration; digital circuits; CMOS process; capacitor mismatches; digital blind background calibration algorithm; digital logic; hardware overhead; inter-stage gain error; pipelined ADC; size 130 nm; Algorithm design and analysis; Analog circuits; Calibration; Convergence; DH-HEMTs; Estimation; Registers;
fLanguage
English
Publisher
ieee
Conference_Titel
New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International
Conference_Location
Grenoble
Type
conf
DOI
10.1109/NEWCAS.2015.7182043
Filename
7182043
Link To Document