DocumentCode :
3478349
Title :
E-plane directional couplers in substrate-integrated waveguide technology
Author :
Labay, Vladimir A. ; Bornemann, Jens
Author_Institution :
Dept. of Electr. & Comput. Eng., Gonzaga Univ., Spokane, WA
fYear :
2008
fDate :
16-20 Dec. 2008
Firstpage :
1
Lastpage :
3
Abstract :
In order to analyze and design components in substrate-integrated waveguide technology, it is important that the transitions to interface ports do not significantly influence the component´s performance. In this paper, it is demonstrated that the commonly used microstrip-to-SIW transitions are not sufficient to evaluate a SIW structure within a SIW environment. Therefore, we present all-dielectric rectangular waveguide interface ports that considerably reduce the reflections at the transition to the SIW component. These new ports are then applied to the design of SIW E-plane couplers, both with standard dual-circular apertures and as Riblet-Saad couplers. It is demonstrated that SIW couplers with return loss and isolation of much better than 20 dB can be designed. Several 10 db and 3 dB couplers covering the entire Ka-band frequency range are presented. The basic design procedure is validated by comparison with measurements and computations available in the common literature.
Keywords :
directional couplers; substrates; waveguides; E-plane directional coupler; Ka-band frequency range; Riblet-Saad coupler; SIW E-plane coupler; SIW environment; SIW structure; all-dielectric rectangular waveguide interface ports; dual-circular aperture; microstrip-to-SIW transition; substrate-integrated waveguide technology; Apertures; Application software; Directional couplers; Frequency; Microstrip; Millimeter wave circuits; Millimeter wave technology; Performance evaluation; Rectangular waveguides; Waveguide components;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
Type :
conf
DOI :
10.1109/APMC.2008.4957920
Filename :
4957920
Link To Document :
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