DocumentCode
3478493
Title
Circuit model of quantum cascade lasers for simulation of influence of doping density
Author
Chang Qi ; Xinzhi Shi ; Ye Shuangli ; Jinguang Jiang
Author_Institution
Inst. of Microelectron. & Inf. Technol., Wuhan Univ., Wuhan, China
fYear
2013
fDate
3-5 June 2013
Firstpage
1
Lastpage
2
Abstract
In this paper, a new equivalent circuit-level model of QCLs is introduced to overcome drawbacks of the previous models. The photon gain coefficient and injection current efficiency both depend on the injector doping density in the model. A revised three-level rate equations that permit a compact and computationally efficient implementation. The electron scattering time, relaxation time and escape time between the corresponding levels are obtained by employing a fully non-equilibrium self-consistent Schrödinger-Poisson analysis of the scattering rate and energy balance equations. A general diode sub-circuit is adopted to model the current-voltage relationship. This new circuit-level model can be readily incorporated into a standard circuit simulation environment such as SPICE, which enables electronic integrated circuit designers to simultaneously evaluate the performance of both QCL and electronic devices.
Keywords
SPICE; doping profiles; electron relaxation time; equivalent circuits; integrated optoelectronics; quantum cascade lasers; semiconductor device models; QCL; SPICE; current-voltage relationship; diode subcircuit; electron scattering time; electronic devices; electronic integrated circuit; energy balance equations; equivalent circuit-level model; escape time; fully nonequilibrium self-consistent Schrodinger-Poisson analysis; injection current efficiency; injector doping density; photon gain coefficient; quantum cascade lasers; relaxation time; scattering rate equations; standard circuit simulation; three-level rate equations; Computational modeling; Integrated circuit modeling; Quantum cascade lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location
Hong Kong
Type
conf
DOI
10.1109/EDSSC.2013.6628222
Filename
6628222
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