• DocumentCode
    3478565
  • Title

    Experimental and simulation studies of single-electron-transistor-based multiple-valued logic

  • Author

    Inokawa, Hiroshi ; Takahashi, Yasuo

  • Author_Institution
    Basic Res. Labs., NTT Corp., Kanagawa, Japan
  • fYear
    2003
  • fDate
    16-19 May 2003
  • Firstpage
    259
  • Lastpage
    266
  • Abstract
    Periodic drain current-gate voltage characteristics of single-electron transistors (SETs) were utilized to construct basic components of multiple-valued logic (MVL), such as a universal literal gate and a quantizer. In order to supplement the small gain and the small applicable voltage of the SET, hybrid SET-MOSFET scheme is proposed and demonstrated experimentally using CMOS-compatible pattern-dependent oxidation (PADOX) technology. We also succeeded in reproducing the results using a SPICE circuit simulator with a compact analytical SET model, and estimated the performance of the proposed MVL.
  • Keywords
    MOSFET; SPICE; multivalued logic; single electron transistors; CMOS-compatible pattern-dependent oxidation technology; PADOX; SET; SPICE circuit simulator; hybrid SET-MOSFET scheme; multiple-valued logic; performance estimation; periodic drain current-gate voltage characteristic; quantizer; single-electron transistor; universal literal gate; Logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multiple-Valued Logic, 2003. Proceedings. 33rd International Symposium on
  • ISSN
    0195-623X
  • Print_ISBN
    0-7695-1918-0
  • Type

    conf

  • DOI
    10.1109/ISMVL.2003.1201415
  • Filename
    1201415