Title :
Statistical characteristic and parameter characterization of 3D surface micro-topography on micro-EDM
Author :
Ding, Haijuan ; Guo, Libin ; Cui, Hai
Author_Institution :
Coll. of Mech. & Electr. Eng., Harbin Eng. Univ., Harbin, China
Abstract :
The characteristic of three-dimensional (3D) surface micro-topography of micro-EDM plays an important role on the component function properties. In this paper, two types of 3D surface micro-topography, which machined by micro-electrical discharge machining forming (micro-EDMF) and micro-wire electrical discharge machining (micro-WEDM), have been measured by the atomic force microscope (AFM) instrument after the surface data have been reshaped and denoised by means of wavelet filter respectively. And then the second-order statistical characteristic functions and six 3D characterization parameters, which connect with function properties, have been presented to comprehensively characterize and compare 3D surface micro-topography of the two types of surfaces. The analysis results show that it is reasonable to characterize the two types of surface micro-topography and the distinction of them can also be described using the statistical functions and 3D parameters. A conclusion has been obtained that the micro-EDMF surface is isotropic and has much better bearing capacity and wear resistance performance than the micro-WEDM surface.
Keywords :
atomic force microscopy; electrical discharge machining; statistical analysis; wear resistance; 3D surface microtopography; atomic force microscope; bearing capacity; micro-EDM; micro-electrical discharge machining forming; micro-wire electrical discharge machining; parameter characterization; statistical characteristic; wavelet filter; wear resistance; Atomic force microscopy; Atomic measurements; Electric variables measurement; Filters; Force measurement; Instruments; Machining; Surface discharges; Surface resistance; Surface waves; 3D surface micro-topography; characterization parameters; micro-EDM; statistical characteristic; wavelet filter;
Conference_Titel :
Automation and Logistics, 2009. ICAL '09. IEEE International Conference on
Conference_Location :
Shenyang
Print_ISBN :
978-1-4244-4794-7
Electronic_ISBN :
978-1-4244-4795-4
DOI :
10.1109/ICAL.2009.5262583