Title :
On the two modes of operation of monolithic Ag-C brushes
Author :
Kuhlmann-Wilsdorf, Doris ; Makel, David D. ; Sondergaard, Neal A. ; Maribo, David
Author_Institution :
Dept. of Mater. Sci., Virginia Univ., Charlottesville, VA, USA
Abstract :
The transition from low-temperature to high-temperature behavior in silver-graphite brushes may be explained either by changes of constriction resistance due to the temperature dependence of electrical resistivity and hardness at negligible film resistivity and one to three contact spots, or by loss of graphite lubrication within the interfacial film. These two interpretations were tested by controlling the contact spot temperature by (1) heating in an oven, and (2) local heat input through friction. Correlated studies of contact resistance, friction, wear rate, wear chip size, and wear chip microstructure, and calculations of contact spot temperatures, favor the second hypothesis. Micrographic evidence suggests that the loss of lubrication occurs through desorption of water vapor from the graphite. It is found that primary wear particles form because of the wedge mechanism and because of cutting by graphite fragments steeply inclined to the interface. Silver fragments may consolidate into secondary wear particles.<>
Keywords :
brushes; composite materials; contact resistance; graphite; silver; Ag fragments; adsorption of water; changes of constriction resistance; contact resistance; contact spot temperature; cutting by graphite fragments; desorption of water vapor; flash temperature; friction; high-temperature behavior; interfacial film; local heat input through friction; loss of graphite lubrication; loss of lubrication; low temperature behaviour; modes of operation; monolithic Ag-C brushes; primary wear particles form; secondary wear particles; temperature dependence; wear chip microstructure; wear chip size; wear rate; wedge mechanism; Brushes; Conductivity; Contact resistance; Electric resistance; Friction; Heating; Lubrication; Temperature control; Temperature dependence; Testing;
Conference_Titel :
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/HOLM.1988.16119