1.5 volts Iddq/Iddt current monitor

Author

Pecuh, I. ; Margala, M. ; Stopjakova, V.

Author_Institution

Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada

Volume

1

fYear

1999

fDate

9-12 May 1999

Firstpage

472

Abstract

A built-in current monitor for low-voltage digital CMOS circuits is presented. The monitor is designed for quiescent current testing (Iddq) and transient current testing (Iddt). Negligible effect on circuit under test performance is obtained. The same design can be used in testing of mixed signal circuits. High testing speed of 100 MHz can be achieved. The monitor has been implemented in 0.5 /spl mu/ and 0.35 /spl mu/ CMOS technology and successfully tested. Simulation results are included and analyzed.

Keywords

CMOS digital integrated circuits; VLSI; circuit simulation; integrated circuit testing; leakage currents; logic testing; low-power electronics; 0.35 micron; 0.5 micron; 1.5 V; 100 MHz; VLSI; current monitor; low-voltage digital CMOS circuits; quiescent current testing; simulation results; testing speed; transient current testing; Circuit faults; Circuit testing; Computerized monitoring; Current supplies; Diodes; Electrical fault detection; Fault detection; Leakage current; Transient analysis; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Computer Engineering, 1999 IEEE Canadian Conference on

Conference_Location

Edmonton, Alberta, Canada

ISSN

0840-7789

Print_ISBN

0-7803-5579-2

Type

conf

DOI

10.1109/CCECE.1999.807244

Filename

807244