Title :
1.5 volts Iddq/Iddt current monitor
Author :
Pecuh, I. ; Margala, M. ; Stopjakova, V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
A built-in current monitor for low-voltage digital CMOS circuits is presented. The monitor is designed for quiescent current testing (Iddq) and transient current testing (Iddt). Negligible effect on circuit under test performance is obtained. The same design can be used in testing of mixed signal circuits. High testing speed of 100 MHz can be achieved. The monitor has been implemented in 0.5 /spl mu/ and 0.35 /spl mu/ CMOS technology and successfully tested. Simulation results are included and analyzed.
Keywords :
CMOS digital integrated circuits; VLSI; circuit simulation; integrated circuit testing; leakage currents; logic testing; low-power electronics; 0.35 micron; 0.5 micron; 1.5 V; 100 MHz; VLSI; current monitor; low-voltage digital CMOS circuits; quiescent current testing; simulation results; testing speed; transient current testing; Circuit faults; Circuit testing; Computerized monitoring; Current supplies; Diodes; Electrical fault detection; Fault detection; Leakage current; Transient analysis; Voltage;
Conference_Titel :
Electrical and Computer Engineering, 1999 IEEE Canadian Conference on
Conference_Location :
Edmonton, Alberta, Canada
Print_ISBN :
0-7803-5579-2
DOI :
10.1109/CCECE.1999.807244
