Title :
Measurement of mass scaling and alternate materials on the NIST electronic kilogram system
Author :
Steiner, R. ; Haddad, D. ; Liu, R. ; Williams, E. ; Davidson, S.
Author_Institution :
Nat. Inst. of Stand. & Technol. (NIST), Gaithersburg, MD, USA
Abstract :
A blind test was conducted with mass references of a 0.5 kg silicon and 1 kg each of steel and gold-plated copper, calibrated in vacuum at the NPL and measured with the watt balance at the National Institute of Standards and Technology (NIST). The results were analyzed against a 1 kg PtIr mass calibrated at NIST. The results showed good and consistent agreement between the Si, steel, and PtIr masses. The Au-plated Cu mass was stable while being measured but may have shifted during the transfer.
Keywords :
calibration; copper; gold; measurement standards; silicon; NIST electronic kilogram system; National Institute of Standards and Technology; gold-plated copper; mass scaling measurement; Coils; Conducting materials; Copper; Electromagnetic measurements; Magnetic field measurement; Magnetic materials; NIST; Silicon; Steel; Testing;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544415