Title :
An Extremely Low-Power Bipolar Current-Mode I/O Circuit for Multi-Gbit/s Interfaces
Author :
Kawamura, T. ; Suzuki, M. ; Ichino, H.
Author_Institution :
NTT LSI Laboratories NTT Electronics Technology Corp.
Keywords :
Crosstalk; Error-free operation; Immunity testing; Impedance matching; Integrated circuit noise; Large scale integration; Power dissipation; Power transmission lines; Switches; Voltage;
Conference_Titel :
VLSI Circuits, 1994. Digest of Technical Papers., 1994 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-1918-4
DOI :
10.1109/VLSIC.1994.586197