• DocumentCode
    3479450
  • Title

    Fourth workshop on dependable and secure nanocomputing

  • Author

    Arlat, Jean ; Constantinescu, Cristian ; Iyer, Ravishankar K. ; Karlsson, Johan ; Nicolaïdis, Michael

  • Author_Institution
    LAAS-CNRS and Université de Toulouse, 7, Av. du Colonel Roche 31077, France
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    619
  • Lastpage
    620
  • Abstract
    Nanocomputing technologies hold the promise for higher performance, lower power consumption as well as increased functionality. However, the dependability of these unprecedentedly small scale devices remains uncertain. The main sources of concern are: • Nanometer devices are expected to be highly sensitive to process variations. The guard-bands used today for avoiding the impact of such variations will not represent a feasible solution in the future. Thus, timing errors may occur more frequently. • New failure modes, specific to new materials, are expected to raise serious challenges to the design and test engineers. • Environment induced errors, like single event upsets (SEU), are likely to occur more frequently than in the case of conventional semiconductor devices. • New hardware redundancy techniques are needed to enable development of energy efficient systems. • The increased complexity of the systems based on nanotechnology will require improved computer aided design (CAD) tools, as well as better validation techniques. • Security of nanocomputing systems may be threatened by malicious attacks targeting new vulnerable areas in the hardware.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544423
  • Filename
    5544423