• DocumentCode
    3479750
  • Title

    Numerical Analysis for Thermo-Mechanical Reliability of Polymers in Electronic Packaging

  • Author

    Dudek, Rainer ; Walter, Hans ; Auersperg, Juergen ; Michel, Bernd

  • Author_Institution
    Micro Mater. Center Berlin & Chemnitz, Berlin
  • fYear
    2007
  • fDate
    Jan. 16 2007-Yearly 18 2007
  • Firstpage
    220
  • Lastpage
    227
  • Abstract
    The universal applicability of polymeric materials in microsystem technology is based on a wide adaptability of their thermo-mechanical as well as their electric/dielectric characteristics. However, as they are generally sensitive to temperature and moisture, obey a misfit in thermal expansion to other electronic materials, and lack a high mechanical strength they are often the weakest link in packaging applications. Finite- element analyses (FEA) are in widespread use to determine the thermo-mechanical performance of the precision material compounds. In theoretical strength analyses the property dependencies on temperature and loading rate are taken into account by viscolelastic material modeling. It is shown the stress effects above the glass transition temperature depend on the constraint situation. In some applications moisture diffusion and swelling has additionally to be considered. Since the adhesive properties are mostly taken advantage of, interface adhesion strength is an additional concern. Accordingly, the phenomenon of stresses at interfaces between dissimilar materials is of special importance within the variety of failure criteria and is therefore discussed in more detail.
  • Keywords
    adhesion; adhesives; electronics packaging; finite element analysis; mechanical strength; polymers; reliability; thermal expansion; viscoelasticity; FEA; adhesive properties; electronic packaging; failure criteria; finite-element analyses; interface adhesion strength; mechanical strength; microsystem technology; numerical analysis; polymer thermomechanical reliability; precision material compounds; thermal expansion; viscolelastic material modeling; Dielectric materials; Electronic packaging thermal management; Electronics packaging; Moisture; Numerical analysis; Polymers; Temperature dependence; Temperature sensors; Thermal expansion; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Polymers and Adhesives in Microelectronics and Photonics, 2007. Polytronic 2007. 6th International Conference on
  • Conference_Location
    Odaiba, Tokyo
  • Print_ISBN
    978-1-4244-1186-3
  • Electronic_ISBN
    978-1-4244-1186-3
  • Type

    conf

  • DOI
    10.1109/POLYTR.2007.4339172
  • Filename
    4339172