Title :
Numerical Analysis for Thermo-Mechanical Reliability of Polymers in Electronic Packaging
Author :
Dudek, Rainer ; Walter, Hans ; Auersperg, Juergen ; Michel, Bernd
Author_Institution :
Micro Mater. Center Berlin & Chemnitz, Berlin
fDate :
Jan. 16 2007-Yearly 18 2007
Abstract :
The universal applicability of polymeric materials in microsystem technology is based on a wide adaptability of their thermo-mechanical as well as their electric/dielectric characteristics. However, as they are generally sensitive to temperature and moisture, obey a misfit in thermal expansion to other electronic materials, and lack a high mechanical strength they are often the weakest link in packaging applications. Finite- element analyses (FEA) are in widespread use to determine the thermo-mechanical performance of the precision material compounds. In theoretical strength analyses the property dependencies on temperature and loading rate are taken into account by viscolelastic material modeling. It is shown the stress effects above the glass transition temperature depend on the constraint situation. In some applications moisture diffusion and swelling has additionally to be considered. Since the adhesive properties are mostly taken advantage of, interface adhesion strength is an additional concern. Accordingly, the phenomenon of stresses at interfaces between dissimilar materials is of special importance within the variety of failure criteria and is therefore discussed in more detail.
Keywords :
adhesion; adhesives; electronics packaging; finite element analysis; mechanical strength; polymers; reliability; thermal expansion; viscoelasticity; FEA; adhesive properties; electronic packaging; failure criteria; finite-element analyses; interface adhesion strength; mechanical strength; microsystem technology; numerical analysis; polymer thermomechanical reliability; precision material compounds; thermal expansion; viscolelastic material modeling; Dielectric materials; Electronic packaging thermal management; Electronics packaging; Moisture; Numerical analysis; Polymers; Temperature dependence; Temperature sensors; Thermal expansion; Thermomechanical processes;
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2007. Polytronic 2007. 6th International Conference on
Conference_Location :
Odaiba, Tokyo
Print_ISBN :
978-1-4244-1186-3
Electronic_ISBN :
978-1-4244-1186-3
DOI :
10.1109/POLYTR.2007.4339172