Title :
Improvement on learning-based super-resolution by adopting residual information and patch reliability
Author :
Kim, Changhyun ; Choi, Kyuha ; Ra, Jong Beom
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Abstract :
Learning-based super-resolution algorithms synthesize high-resolution details by using training data. However, since an input image does not belong to a training image set, there is a limitation in recovering its high-frequency details. In our approach, we build and utilize residual training data to complement missing details. We first estimate a pair of mid- and high-frequency images of each training image by using ordinary training data. We then build residual training data by obtaining the residual mid-and high-frequency images that denote the difference between the estimation and original. Thereby, we can synthesize high-resolution details better by using both ordinary and residual training data sets. In addition, in order to use training data more efficiently, we adaptively select low-resolution patches in an input image. Experimental results demonstrate that the proposed method can synthesize higher-resolution images compared to the existing algorithms.
Keywords :
image resolution; learning (artificial intelligence); learning based super resolution; patch reliability; residual information adoption; residual training data; training image set; Bayesian methods; Estimation error; Frequency estimation; Geometry; Image analysis; Image resolution; Interpolation; Markov random fields; Network synthesis; Training data; Super-resolution; learning; reliability; residual;
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2009.5413697