• DocumentCode
    3479841
  • Title

    Shear strength and brittle failure of low-Ag SAC-Bi-Ni solder joints during ball shear test

  • Author

    Liu Yang ; Sun Fenglian ; Yang Miaosen

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2013
  • fDate
    11-14 Aug. 2013
  • Firstpage
    750
  • Lastpage
    753
  • Abstract
    This paper investigated the shear strength and failure mechanism of low-Ag SAC-BiNi solder joints in comparison with SAC0705 and SAC305 solder joints. Experimental results demonstrated that the shear strength of SAC0705-BiNi/Cu solder joint was higher than SAC0705/Cu and SAC305/Cu solder joints before and after HTS aging. Moreover, SAC0705-BiNi/Cu solder joint has the smallest IMC grains and the highest resistance for the spread of shear crack in the three kinds of solder joints after reflow. After HTS aging, the interfacial microstructure of the investigated solder joints coarsened and the shear strength of these solder joints decreased. In SAC0705/Cu and SAC305/Cu solder joints, the failure of the solder joints is due to the ductile fracture of the bulk solder of the solder joints and the brittle broken of the individual large IMC grains. Meanwhile, the failure of SAC0705-BiNi/Cu is mostly because of the broken of interfacial IMC and the separation between IMC and the bulk solder of the solder joins.
  • Keywords
    bismuth alloys; copper alloys; cracks; ductile fracture; electronics packaging; nickel alloys; shear strength; silver alloys; solders; testing; tin alloys; HTS aging; SnAgCu-BiNi; ball shear test; brittle failure; bulk solder; ductile fracture; interfacial microstructure; shear crack; shear strength; solder joints; Aging; Electronics packaging; High-temperature superconductors; Metals; Morphology; Soldering; Sn-Ag-Cu (SAC); brittle failure; intermetallic compounds (IMC); low-Ag;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
  • Conference_Location
    Dalian
  • Type

    conf

  • DOI
    10.1109/ICEPT.2013.6756574
  • Filename
    6756574