Title :
Mechanisms of high power laser diode
Author :
Lu Guoguang ; Lai Canxiong ; Huang Yun ; En YunFei
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., China Electron. Product Reliability & Environ. Testing Res. Inst., Guang Zhou, China
Abstract :
A fault tree of high power laser diode have been set up, include sudden failure mode, gradual degradation mode, open failure and short failure mode are analyzed in detail with several cases, some methods about improving the reliability of laser diode have been provided subsequently in this paper.
Keywords :
fault trees; power semiconductor diodes; semiconductor device reliability; semiconductor lasers; fault tree; gradual degradation mode; high power laser diode; open failure mode; reliability; short failure mode; sudden failure mode; Crystals; Degradation; Diode lasers; Reliability; Semiconductor lasers; Stress; Thermal stresses; failure analysis; failure mechanisms; lifetime; reliability;
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
DOI :
10.1109/ICEPT.2013.6756576
