DocumentCode
3479953
Title
Novel Polymer Dielectrics for Wafer Level High Density Interconnect
Author
Yokotsuka, Shunsuke
Author_Institution
Asahi Glass Co. Ltd., Yokohama
fYear
2007
fDate
Jan. 16 2007-Yearly 18 2007
Firstpage
287
Lastpage
289
Abstract
Properties and processability of a new class of thermosetting fluorinated polymer are described. This polymer possesses excellent electrical properties (low dielectric constant and low dielectric loss), optical properties (low absorption and low birefringence), mechanical properties, heat stability, and chemical durability due to its fluorinated rigid backbone and highly crosslinked structure. Both dry-etch and photosensitive formulations are discussed from the viewpoint of reliability and processing requirements for wafer level high density interconnect and packaging such as thin-film formation, adhesion, planarization, stacking and fine patterning capabilities.
Keywords
chip scale packaging; dielectric materials; integrated circuit interconnections; integrated circuit packaging; polymers; wafer level packaging; adhesion; chemical durability; fluorinated rigid backbone; heat stability; highly crosslinked structure; low dielectric constant; low dielectric loss; mechanical properties; planarization; polymer dielectrics; thermosetting fluorinated polymer; thin-film formation; wafer level high density interconnect; Absorption; Birefringence; Dielectric constant; Dielectric losses; Mechanical factors; Optical interconnections; Optical losses; Optical polymers; Resistance heating; Stability; Dry-etch; Packaging; Photosensitive; Polymer dielectrics; WL-CSP; Wafer level interconnect;
fLanguage
English
Publisher
ieee
Conference_Titel
Polymers and Adhesives in Microelectronics and Photonics, 2007. Polytronic 2007. 6th International Conference on
Conference_Location
Odaiba, Tokyo
Print_ISBN
978-1-4244-1186-3
Electronic_ISBN
978-1-4244-1186-3
Type
conf
DOI
10.1109/POLYTR.2007.4339184
Filename
4339184
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