• DocumentCode
    3479953
  • Title

    Novel Polymer Dielectrics for Wafer Level High Density Interconnect

  • Author

    Yokotsuka, Shunsuke

  • Author_Institution
    Asahi Glass Co. Ltd., Yokohama
  • fYear
    2007
  • fDate
    Jan. 16 2007-Yearly 18 2007
  • Firstpage
    287
  • Lastpage
    289
  • Abstract
    Properties and processability of a new class of thermosetting fluorinated polymer are described. This polymer possesses excellent electrical properties (low dielectric constant and low dielectric loss), optical properties (low absorption and low birefringence), mechanical properties, heat stability, and chemical durability due to its fluorinated rigid backbone and highly crosslinked structure. Both dry-etch and photosensitive formulations are discussed from the viewpoint of reliability and processing requirements for wafer level high density interconnect and packaging such as thin-film formation, adhesion, planarization, stacking and fine patterning capabilities.
  • Keywords
    chip scale packaging; dielectric materials; integrated circuit interconnections; integrated circuit packaging; polymers; wafer level packaging; adhesion; chemical durability; fluorinated rigid backbone; heat stability; highly crosslinked structure; low dielectric constant; low dielectric loss; mechanical properties; planarization; polymer dielectrics; thermosetting fluorinated polymer; thin-film formation; wafer level high density interconnect; Absorption; Birefringence; Dielectric constant; Dielectric losses; Mechanical factors; Optical interconnections; Optical losses; Optical polymers; Resistance heating; Stability; Dry-etch; Packaging; Photosensitive; Polymer dielectrics; WL-CSP; Wafer level interconnect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Polymers and Adhesives in Microelectronics and Photonics, 2007. Polytronic 2007. 6th International Conference on
  • Conference_Location
    Odaiba, Tokyo
  • Print_ISBN
    978-1-4244-1186-3
  • Electronic_ISBN
    978-1-4244-1186-3
  • Type

    conf

  • DOI
    10.1109/POLYTR.2007.4339184
  • Filename
    4339184