DocumentCode :
3480011
Title :
Study on moisture-induced corrosion mechanism of copper wire bonding by thermodynamic calculation
Author :
Yingzhi Zeng ; Kewu Bai ; Hongmei Jin
Author_Institution :
Inst. of High Performance Comput., Agency for Sci., Singapore, Singapore
fYear :
2013
fDate :
11-14 Aug. 2013
Firstpage :
777
Lastpage :
780
Abstract :
Understanding the moisture-induced corrosion mechanism of copper wire bonding is crucial for achieving longer life reliability of copper bonding. While the formation of Al-Cu intermetallic compound (IMC) is found to dominate the bond reliability, the mechanism remains unclear despite considerable efforts by experiments. Pourbaix (Eh-pH) diagrams have long been used to evaluate the theoretical activity of a given metal or alloy in a corrosion situation. However, the Eh-pH diagram of Cu-Al alloy in bonding condition is lack. In this work, by assessing various thermodynamic data of Cu-Al-Cl-H2O, we construct the Pourbaix diagrams associated with Cu bonding involving IMCs and study the corrosion behaviors under various environmental parameters such as temperatures and chloride concentrations. The results yield greater insight into the corrosion mechanism which may lead to improving reliability of Cu bonding.
Keywords :
aluminium alloys; chlorine; copper alloys; corrosion resistance; lead bonding; moisture; reliability; water; Al-Cu; Al-Cu IMC; Al-Cu intermetallic compound; Cu bonding reliability; Cu-Al alloy; Cu-Al-Cl-H2O; Eh-pH diagrams; Pourbaix diagrams; bond reliability; chloride concentrations; copper wire bonding; longer life reliability; moisture-induced corrosion mechanism; Bonding; Compounds; Copper; Corrosion; Reliability; Thermodynamics; Wires; Pourbaix diagram; bonding; copper; intermetallics; modeling; passivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
Type :
conf
DOI :
10.1109/ICEPT.2013.6756580
Filename :
6756580
Link To Document :
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