DocumentCode :
3480020
Title :
Statistical Tolerance Methods For Manufacturing
Author :
Miller, Steven R.
Author_Institution :
David Sarnoff Research Center
fYear :
1991
fDate :
16-18 April 1991
Firstpage :
306
Lastpage :
315
Abstract :
This goal of this paper is to present a computational methodology based upon statistical tolerance models that we have employed for many and diverse applications that has particular value as a concurrent engineering technique and, thus, a technique for improving product quality and reliability. We will present the generic framework that we follow that is common to all applications of this technique. Then we will give two real-life examples of applications of this methodology and how it was used to achieve several of the goals of concurrent and computer aided engineering.
Keywords :
Application software; Computer aided engineering; Computer simulation; Concurrent computing; Concurrent engineering; Context modeling; Costs; Manufacturing processes; Predictive models; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electro International, 1991
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/ELECTR.1991.718225
Filename :
718225
Link To Document :
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