Title :
An Experimental Cascade Cell Dynamic Memory
Author :
Stark, D. ; Watanabe, H. ; Furuyama, T.
Author_Institution :
Rambus Inc., Mountain View, CA, USA
Keywords :
Bandwidth; Capacitors; Circuits; Costs; Decoding; Lithography; Random access memory; Shift registers; Virtual manufacturing;
Conference_Titel :
VLSI Circuits, 1994. Digest of Technical Papers., 1994 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-1918-4
DOI :
10.1109/VLSIC.1994.586230
