Title :
Fault Detection And Classification In Linear Microcircuits
Author :
Epstein, Benjamin R ; Czigler, Martin H.
Author_Institution :
David Sarnoff Research Center
Abstract :
Classical discrimination analysis and neural network techniques are used to detect and classify possible faults in linear microcircuits. The success rates of simulated fault detection and classification are described for various types of analog and mixed-mode circuits.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Covariance matrix; Electrical fault detection; Fault detection; Fault diagnosis; Neural networks; Performance analysis; Voltage;
Conference_Titel :
Electro International, 1991
Conference_Location :
New York, NY, USA
DOI :
10.1109/ELECTR.1991.718227
