• DocumentCode
    3480046
  • Title

    Fault Detection And Classification In Linear Microcircuits

  • Author

    Epstein, Benjamin R ; Czigler, Martin H.

  • Author_Institution
    David Sarnoff Research Center
  • fYear
    1991
  • fDate
    16-18 April 1991
  • Firstpage
    319
  • Lastpage
    321
  • Abstract
    Classical discrimination analysis and neural network techniques are used to detect and classify possible faults in linear microcircuits. The success rates of simulated fault detection and classification are described for various types of analog and mixed-mode circuits.
  • Keywords
    Circuit faults; Circuit simulation; Circuit testing; Covariance matrix; Electrical fault detection; Fault detection; Fault diagnosis; Neural networks; Performance analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro International, 1991
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ELECTR.1991.718227
  • Filename
    718227
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3480046