DocumentCode
3480061
Title
Statistical Control Of Electronic Measurements
Author
Stein, Philip G.
fYear
1991
fDate
16-18 April 1991
Firstpage
322
Lastpage
324
Abstract
Methods and techniques commonly used in statistical process control of manufacturing are briefly shown to be directly applicable to improvement and control of measurements. When those measurements are part of a control system and are themselves controlled in this way, considerable improvements in system performance, productivity, and quality are possible.
Keywords
Automatic control; Control systems; Electrical resistance measurement; Feedback loop; Manufacturing processes; Noise measurement; Process control; Production; System performance; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro International, 1991
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ELECTR.1991.718228
Filename
718228
Link To Document