• DocumentCode
    3480249
  • Title

    Transient electro-thermo-mechanical responses of wire bonding interconnects illuminated by an electromagnetic pulse

  • Author

    Kong, Fan-Zhi ; Yin, Wen-Yan ; Mao, Jun-Fa ; Liu, Qing Huo

  • Author_Institution
    Center for Microwave & RF Technol., Shanghai Jiao Tong Univ., Shanghai
  • fYear
    2008
  • fDate
    16-20 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a hybrid physical simulation method is implemented so as to characterize transient temperature and stress responses in wire bonding interconnects in high-density 3-D ICs under the impact of an EMP. Our self-developed algorithm is based on time-domain FEM, which is capable of handling interactions and coupling among different physical fields. In particular, temperature-dependent nonlinearities of electrical conductivities, thermal conductivities, thermal expansion coefficients, and even the Young´s modulus of all materials involved are treated rigorously.
  • Keywords
    Young´s modulus; finite element analysis; integrated circuit interconnections; lead bonding; thermal conductivity; Young´s modulus; electrical conductivities; electromagnetic pulse; finite element method; high-density 3D integrated circuit; hybrid physical simulation method; stress responses; temperature-dependent nonlinearities; thermal conductivities; thermal expansion coefficients; time-domain FEM; transient electro-thermo-mechanical responses; transient temperature; wire bonding interconnects; Bonding; Conducting materials; EMP radiation effects; Electromagnetic transients; Temperature; Thermal conductivity; Thermal expansion; Thermal stresses; Time domain analysis; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. APMC 2008. Asia-Pacific
  • Conference_Location
    Macau
  • Print_ISBN
    978-1-4244-2641-6
  • Electronic_ISBN
    978-1-4244-2642-3
  • Type

    conf

  • DOI
    10.1109/APMC.2008.4958006
  • Filename
    4958006