• DocumentCode
    3480353
  • Title

    Folded-read And Open/folded-restore Bit-line Scheme For Giga Scale 6f2 Dram Cell

  • Author

    Takashima, D. ; Nakano, H. ; Ozaki, T. ; Oowaki, Y. ; Shiratake, S. ; Watanabe, S. ; Ohuchi, K.

  • Author_Institution
    Ulsi Research Laboratories, Research And Development Center, Toshiba Corporation
  • fYear
    1994
  • fDate
    9-11 June 1994
  • Firstpage
    121
  • Lastpage
    122
  • Keywords
    Capacitance; Circuit noise; Coupling circuits; Laboratories; Noise figure; Noise generators; Noise reduction; Random access memory; Research and development; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1994. Digest of Technical Papers., 1994 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-1918-4
  • Type

    conf

  • DOI
    10.1109/VLSIC.1994.586246
  • Filename
    586246
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3480353