3480353

Folded-read And Open/folded-restore Bit-line Scheme For Giga Scale 6f2 Dram Cell

Takashima, D. ; Nakano, H. ; Ozaki, T. ; Oowaki, Y. ; Shiratake, S. ; Watanabe, S. ; Ohuchi, K.

Ulsi Research Laboratories, Research And Development Center, Toshiba Corporation

1994

9-11 June 1994

121

122

Capacitance; Circuit noise; Coupling circuits; Laboratories; Noise figure; Noise generators; Noise reduction; Random access memory; Research and development; Ultra large scale integration;

English

ieee

VLSI Circuits, 1994. Digest of Technical Papers., 1994 Symposium on

Honolulu, HI, USA

0-7803-1918-4

conf

10.1109/VLSIC.1994.586246

586246