DocumentCode
3480525
Title
An improved way to measure thermal impedance of insulated gate bipolar transistor (IGBT) module for power electronic packaging
Author
Guo-Quan Lu ; Meiyu Wang ; Yunhui Mei ; Xin Li ; Lei Wang ; Gang Chen ; Xu Chen
Author_Institution
Tianjin Key Lab. of Adv. Joining Technol., Tianjin Univ., Tianjin, China
fYear
2013
fDate
11-14 Aug. 2013
Firstpage
870
Lastpage
878
Abstract
Recently, silver paste, silver epoxy, and solders were commonly used as die-attach materials for power electronic packaging. Thermal performance of these materials should be paid attention to since reliability of sintered or soldered jointsis highly dependent on the thermal performance. To accurately investigate the transient thermal behavior of sintered or soldered joints in electronic applications, an improved way and system for thermal impedance measurement were developed in this paper. A series of measurements utilized gate-emitter voltage as temperature-sensitive parameter at varies heating time and heating power were conducted. Significantly, through changing the heat input, the specific thermal impedance of any layer could be obtained with high accuracy, repeatability, and stability. In this way, it would be useful to understand how thermal performance of power modules varies with architecture and materials for power electronic packaging.
Keywords
insulated gate bipolar transistors; modules; power semiconductor devices; semiconductor device packaging; thermal variables measurement; IGBT; die attach materials; gate-emitter voltage; heating power; heating time; insulated gate bipolar transistor; power electronic packaging; silver epoxy; silver paste; sintered joint; soldered jointsis; temperature sensitive parameter; thermal behavior; thermal impedance measurement; thermal performance; Electronic packaging thermal management; Heating; Impedance measurement; Insulated gate bipolar transistors; Logic gates; Resistance; Temperature measurement; Rth ; Zth ; gate-emitter voltage; insulated gate bipolar transistor (IGBT); thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location
Dalian
Type
conf
DOI
10.1109/ICEPT.2013.6756601
Filename
6756601
Link To Document