DocumentCode
3480639
Title
Accurate power estimation for CMOS circuits
Author
Shiue, Wen-Tsong
Author_Institution
Silicon Metrics Corp., Austin, TX, USA
Volume
2
fYear
2001
fDate
2001
Firstpage
829
Abstract
In this paper, we develop a new analytical equation model for power estimation because of its properties of low runtime, less storage, and high accuracy for Very Deep Sub-micron Semiconductor (VDSM) CMOS gates. Our analytical equation model consists of (i) a physical α-power law MOSFET model of simple mathematical form and high degree of accuracy for the I/V characteristics for the specific pMOS and nMOS, (ii) analysis and future trend of short-circuit power model with inclusion of short-channel effects through a velocity saturation index (α) of the α-power law MOSFET model and more accuracy than the previously published formulas for the specific CMOS gate, and (iii) equation model from BSIM3 manual. We demonstrate our analytical model on some benchmark gates and show the error of 2.72% in average. In addition, we simulate our equation model in machine SUNW, Ultra-5-10 aid it only takes 2-4 seconds. Furthermore, only a few storages are needed for the Netlist information instead of thousands of look-up tables for transistors and logic cells
Keywords
CMOS logic circuits; SPICE; VLSI; integrated circuit modelling; leakage currents; power consumption; short-circuit currents; BSIM3 manual; C++ compiler; CMOS circuits; HSPICE; I-V characteristics; MOSFET model; Netlist information; accurate power estimation; analytical equation model; benchmark gates; cell functions; leakage-power; low runtime; physical α-power law model; short-channel effects; short-circuit power model; static CMOS gate; switching power; transistor-level simulator; velocity saturation index; very deep submicron CMOS gates; Analytical models; Capacitance; Circuits; Equations; Mathematical model; Power dissipation; SPICE; Semiconductor device modeling; Threshold voltage; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2001. Proceedings of IEEE Region 10 International Conference on Electrical and Electronic Technology
Print_ISBN
0-7803-7101-1
Type
conf
DOI
10.1109/TENCON.2001.949709
Filename
949709
Link To Document