• DocumentCode
    3480639
  • Title

    Accurate power estimation for CMOS circuits

  • Author

    Shiue, Wen-Tsong

  • Author_Institution
    Silicon Metrics Corp., Austin, TX, USA
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    829
  • Abstract
    In this paper, we develop a new analytical equation model for power estimation because of its properties of low runtime, less storage, and high accuracy for Very Deep Sub-micron Semiconductor (VDSM) CMOS gates. Our analytical equation model consists of (i) a physical α-power law MOSFET model of simple mathematical form and high degree of accuracy for the I/V characteristics for the specific pMOS and nMOS, (ii) analysis and future trend of short-circuit power model with inclusion of short-channel effects through a velocity saturation index (α) of the α-power law MOSFET model and more accuracy than the previously published formulas for the specific CMOS gate, and (iii) equation model from BSIM3 manual. We demonstrate our analytical model on some benchmark gates and show the error of 2.72% in average. In addition, we simulate our equation model in machine SUNW, Ultra-5-10 aid it only takes 2-4 seconds. Furthermore, only a few storages are needed for the Netlist information instead of thousands of look-up tables for transistors and logic cells
  • Keywords
    CMOS logic circuits; SPICE; VLSI; integrated circuit modelling; leakage currents; power consumption; short-circuit currents; BSIM3 manual; C++ compiler; CMOS circuits; HSPICE; I-V characteristics; MOSFET model; Netlist information; accurate power estimation; analytical equation model; benchmark gates; cell functions; leakage-power; low runtime; physical α-power law model; short-channel effects; short-circuit power model; static CMOS gate; switching power; transistor-level simulator; velocity saturation index; very deep submicron CMOS gates; Analytical models; Capacitance; Circuits; Equations; Mathematical model; Power dissipation; SPICE; Semiconductor device modeling; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2001. Proceedings of IEEE Region 10 International Conference on Electrical and Electronic Technology
  • Print_ISBN
    0-7803-7101-1
  • Type

    conf

  • DOI
    10.1109/TENCON.2001.949709
  • Filename
    949709