DocumentCode :
3480761
Title :
High frequency ion sources for ion implanters-theoretical and practical comparison
Author :
Ito, Hiroyuki ; Sakudo, Noriyuki
Author_Institution :
Implant Div., Appl. Materials, Horsham, UK
fYear :
1996
fDate :
16-21 Jun 1996
Firstpage :
291
Lastpage :
294
Abstract :
High frequency plasma sources have been widely used in various fields such as nuclear physics research and semiconductor device fabrications. Although the application of this source technology for ion implanters has been relatively limited, they present a significant advantage in certain areas compared with conventional DC arc discharge sources. Source life time and beam purity are noted as the major potential features. This paper discusses the characteristics of two major types of high frequency sources, radio frequency (RF) and microwave sources, in terms of the nature of the plasma generated, and predicts advantages and disadvantages of each for application to ion implanters used in modern semiconductor fabrication
Keywords :
ion implantation; ion sources; beam purity; high frequency ion source; ion implanter; lifetime; microwave source; plasma source; radio frequency source; semiconductor device fabrication; Arc discharges; Character generation; Fabrication; Ion sources; Nuclear physics; Plasma applications; Plasma properties; Plasma sources; Radio frequency; Semiconductor devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology. Proceedings of the 11th International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3289-X
Type :
conf
DOI :
10.1109/IIT.1996.586265
Filename :
586265
Link To Document :
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