DocumentCode
3480761
Title
High frequency ion sources for ion implanters-theoretical and practical comparison
Author
Ito, Hiroyuki ; Sakudo, Noriyuki
Author_Institution
Implant Div., Appl. Materials, Horsham, UK
fYear
1996
fDate
16-21 Jun 1996
Firstpage
291
Lastpage
294
Abstract
High frequency plasma sources have been widely used in various fields such as nuclear physics research and semiconductor device fabrications. Although the application of this source technology for ion implanters has been relatively limited, they present a significant advantage in certain areas compared with conventional DC arc discharge sources. Source life time and beam purity are noted as the major potential features. This paper discusses the characteristics of two major types of high frequency sources, radio frequency (RF) and microwave sources, in terms of the nature of the plasma generated, and predicts advantages and disadvantages of each for application to ion implanters used in modern semiconductor fabrication
Keywords
ion implantation; ion sources; beam purity; high frequency ion source; ion implanter; lifetime; microwave source; plasma source; radio frequency source; semiconductor device fabrication; Arc discharges; Character generation; Fabrication; Ion sources; Nuclear physics; Plasma applications; Plasma properties; Plasma sources; Radio frequency; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology. Proceedings of the 11th International Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-3289-X
Type
conf
DOI
10.1109/IIT.1996.586265
Filename
586265
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