• DocumentCode
    3480761
  • Title

    High frequency ion sources for ion implanters-theoretical and practical comparison

  • Author

    Ito, Hiroyuki ; Sakudo, Noriyuki

  • Author_Institution
    Implant Div., Appl. Materials, Horsham, UK
  • fYear
    1996
  • fDate
    16-21 Jun 1996
  • Firstpage
    291
  • Lastpage
    294
  • Abstract
    High frequency plasma sources have been widely used in various fields such as nuclear physics research and semiconductor device fabrications. Although the application of this source technology for ion implanters has been relatively limited, they present a significant advantage in certain areas compared with conventional DC arc discharge sources. Source life time and beam purity are noted as the major potential features. This paper discusses the characteristics of two major types of high frequency sources, radio frequency (RF) and microwave sources, in terms of the nature of the plasma generated, and predicts advantages and disadvantages of each for application to ion implanters used in modern semiconductor fabrication
  • Keywords
    ion implantation; ion sources; beam purity; high frequency ion source; ion implanter; lifetime; microwave source; plasma source; radio frequency source; semiconductor device fabrication; Arc discharges; Character generation; Fabrication; Ion sources; Nuclear physics; Plasma applications; Plasma properties; Plasma sources; Radio frequency; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology. Proceedings of the 11th International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-3289-X
  • Type

    conf

  • DOI
    10.1109/IIT.1996.586265
  • Filename
    586265