DocumentCode :
3480995
Title :
Research on the rework process of the ceramic ball grid array package
Author :
Yingzhuo Huang ; Bo Huang ; Pengrong Lin ; Yusheng Cao ; Binhao Lian ; Quanbin Yao
Author_Institution :
Beijing Microelectron. Technol. Inst., Beijing, China
fYear :
2013
fDate :
11-14 Aug. 2013
Firstpage :
976
Lastpage :
980
Abstract :
Ceramic ball grid array (CBGA) package is becoming increasingly popular as a high-density, high I/O count and high-performance packaging formation in the application of the aviation and spaceflight area. However, the undeveloped rework process restricts the development of the CBGA process and the application of the CBGA component. This paper made a research on the rework process of the CBGA package, it specifically discussed the coplanarity, the position, the void rate and the solder joint strength. By design of the daisy-chain substrate, the board-level reliability of the CBGA package was investigated. This study showed that the reworked CBGA component with high strength, low void rate, good coplanarity and high reliability was available by the proper rework process and could meet the requirement of the formal product.
Keywords :
ball grid arrays; ceramic packaging; reliability; CBGA; I/O count; board-level reliability; ceramic ball grid array package; daisy-chain substrate; rework process; solder joint strength; void rate; Ceramics; Electronics packaging; Joints; Reliability; Substrates; Surface morphology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
Type :
conf
DOI :
10.1109/ICEPT.2013.6756623
Filename :
6756623
Link To Document :
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