DocumentCode
3481059
Title
The microstructure and shear behaviors of the solder joints with decreasing diameter in WLCSP
Author
Xiao Li ; Lin Lin ; Jun Wang
Author_Institution
Dept. of Mater. Sci., Fudan Univ., Shanghai, China
fYear
2013
fDate
11-14 Aug. 2013
Firstpage
991
Lastpage
993
Abstract
The micro solder joints serve as mechanical supporting and electrical connections in assembly of WLCSP devices on board-level. As the requirements of miniaturization, weight reduction in modern electronic devices, the dimension of solder joints is decreasing as small as 100um due to higher-density connections and smaller chip size. The integration of the solder joints is one of the key problems related to the reliability of assembly devices. In this study, the WLCSP samples with micro SAC(Sn-Ag-Cu) solder joints which diameters from 100um to 300um were prepared. The IMC thickness and shear behaviors of the solder joints with different dimensions were investigated. The IMC thickness was studied by cross-section observations when samples were subjected to solder reflow or not. By the single ball shear testing, the failure modes of solder joints were summarized. The relationships between IMC thickness and shear failure modes for the decreasing solder joints´ diameters were discussed.
Keywords
communicating sequential processes; copper alloys; silver alloys; solders; tin alloys; wafer level packaging; IMC; Sn-Ag-Cu; WLCSP; assembly device reliability; electrical connections; electronic devices; higher-density connections; micro solder joints; shear failure; single ball shear testing; size 100 mum to 300 mum; solder reflow; Educational institutions; Electronics packaging; Lead; Microstructure; Reliability; Soldering; microstructure; shear test; size effect; solder joint;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location
Dalian
Type
conf
DOI
10.1109/ICEPT.2013.6756626
Filename
6756626
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