DocumentCode :
348128
Title :
Flip chip interconnect analysis at millimetre wave frequencies
Author :
Wong, Y.L. ; Patrison, L. ; Linton, D.
Author_Institution :
Sch. of Electr. & Electron. Eng., Queen´´s Univ., Belfast, UK
fYear :
1999
fDate :
1999
Firstpage :
82
Lastpage :
87
Abstract :
This paper examines the variation of RF performance on a flip chip due to changes in bump height, bump position, bump shape and number of bumps per interconnect. A full 3D electromagnetic simulator is used extensively to compute the scattering parameter response, impedance and electric field distributions. Varying the bump height will change the reflection coefficient and return loss at millimetre wave frequencies significantly. It is found that proper bump positioning could improve the return loss of the structure. Different bump shape also affects the RF performance of the flip chip. Tapered bump shape gives the best return loss and the lowest reflection coefficient
Keywords :
S-parameters; chip scale packaging; circuit simulation; coplanar waveguides; electric fields; electric impedance; electromagnetic wave reflection; flip-chip devices; integrated circuit interconnections; millimetre wave integrated circuits; 3D electromagnetic simulator; MMIC; RF performance variation; bump position; bump shape; coplanar structure; coplanar waveguide technology; electric field distribution; flip chip interconnect analysis; impedance; millimetre wave frequencies; packaging; reflection coefficient; return loss; scattering parameter response; tapered bump shape; Computational modeling; Distributed computing; Electromagnetic fields; Electromagnetic reflection; Electromagnetic scattering; Flip chip; Impedance; Radio frequency; Scattering parameters; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Frequency Postgraduate Student Colloquium, 1999
Conference_Location :
Leeds
Print_ISBN :
0-7803-5577-6
Type :
conf
DOI :
10.1109/HFPSC.1999.809284
Filename :
809284
Link To Document :
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