Title :
250W S-band 4H-SiC MESFET
Author :
Chen, H. ; Mo, J.H. ; Li, L. ; Pan, H.S. ; Feng, Z. ; Yang, F. ; Cai, S.J.
Author_Institution :
Hebei Semicond. Res. Inst., Shijiazhuang
Abstract :
Internally-matched 4H-SiC MESFET with 4times20 mm of the total gate width was demonstrated. The SiC MESFET structure consists of a channel layer with doping concentration of 2.3times1017 cm-3 and a cap layer with doping concentration of 1.5times1019 cm-3. A lightly p-doped buffer layer was employed between the substrate and the channel layer. Dry etching and high-temperature oxidation were employed to expose the channel layer and remove the surface damage for the gate. The ohmic contact resistivity of 2times10-6 Omegaldrcm2 was achieved. The pulsed (300 mus, 10%) output power, gain and power-added efficiency of the internally-matched device measured at 2 GHz were 250 W, 10.5 dB, and 30%, respectively.
Keywords :
Schottky gate field effect transistors; buffer layers; etching; microwave devices; ohmic contacts; semiconductor device manufacture; silicon compounds; wide band gap semiconductors; MESFET structure; S-band 4H-SiC MESFET; SiC; channel layer; doping concentration; dry etching; frequency 2 GHz; gain 10.5 dB; high-temperature oxidation; lightly p-doped buffer layer; ohmic contact resistivity; power 250 W; size 20 mm; size 4 mm; substrate layer; surface damage; Buffer layers; Conductivity; Doping; Dry etching; MESFETs; Ohmic contacts; Oxidation; Power generation; Pulse measurements; Silicon carbide; High power; SiC MESFET;
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
DOI :
10.1109/APMC.2008.4958052