DocumentCode :
3481480
Title :
RAPIDITAS: RAPId Design-Space-Exploration Incorporating Trace-Based Analysis and Simulation
Author :
Singh, A.K. ; Das, Aruneema ; Kumar, Ajit
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear :
2013
fDate :
4-6 Sept. 2013
Firstpage :
836
Lastpage :
843
Abstract :
Simulation-based Design Space Exploration (DSE) to evaluate all possible mappings for a given application and Multiprocessor-System-on-Chip (MPSoC) platform is computationally costly for large problems. Even using efficient exploration methodologies to evaluate the mappings cannot overcome the evaluation time bottleneck. This paper presents a novel DSE methodology that analyzes the execution trace to prune the vast design space. Simulations are employed only on the pruned design points (mappings), hence reducing the number of simulations. The methodology performs iterative exploration and provides premier mappings requiring different number of processors, which can be used at run-time subject to desired performance and available platform processors. We evaluate our methodology by using models of real-life multimedia applications and demonstrate that the DSE time is reduced by 72% while generating high quality mappings.
Keywords :
iterative methods; multimedia systems; multiprocessing systems; system-on-chip; MPSoC; RAPIDITAS; RAPId design-space-exploration incorporating trace-based analysis and simulation; iterative exploration; multiprocessor-system-on-chip platform; novel DSE methodology; real-life multimedia applications; simulation-based design space exploration; Analytical models; Computational modeling; Decoding; Estimation; Program processors; Throughput; Tiles; Design Space Exploration; Multiprocessor-System-on-Chip (MPSoC); Run-time Mapping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design (DSD), 2013 Euromicro Conference on
Conference_Location :
Los Alamitos, CA
Type :
conf
DOI :
10.1109/DSD.2013.93
Filename :
6628367
Link To Document :
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