DocumentCode
3481539
Title
Reliability of hermetically packaged 980 nm diode lasers
Author
Sharps, Julia A.
Author_Institution
Corning Inc., NY, USA
Volume
2
fYear
1994
fDate
31 Oct-3 Nov 1994
Firstpage
35
Abstract
Since 1992, we have tested 980 nm laser diodes from three manufacturers, in pumps fabricated by four packagers, for reliability and fitness for use in Er-doped optical fiber amplifiers. We have found that when high-power 980 nm lasers are hermetically sealed in inert gas, regardless of laser or package origin, a large number experience a catastrophic failure mode that apparently does not occur in lasers that are lifetested as chip-on-carrier. We call this phenomenon packaging-induced failure
Keywords
seals (stoppers); 980 nm; Er-doped optical fiber amplifiers; catastrophic failure mode; chip-on-carrier; hermetically packaged 980 nm diode laser reliability; high-power; inert gas; lifetested; packaging-induced failure; Diode lasers; Fiber lasers; Gas lasers; Hermetic seals; Laser modes; Manufacturing; Optical fiber amplifiers; Optical fiber testing; Packaging; Pump lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location
Boston, MA
Print_ISBN
0-7803-1470-0
Type
conf
DOI
10.1109/LEOS.1994.586302
Filename
586302
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