DocumentCode
348169
Title
Pulsed laser deposition of metallic oxide thin films for microelectronic applications
Author
Varela, M. ; Trtik, V. ; Guerrero, C. ; Roldan, J. ; Benitez, F. ; Ferrater, C. ; Sanchez, F. ; Bibes, M. ; Rubi, R. ; Fabrega, L. ; Martinez, B. ; Fontcuberta, J.
Author_Institution
Dept. de Fisica Aplicada i Opt., Barcelona Univ., Spain
Volume
1
fYear
1999
fDate
5-9 Oct. 1999
Firstpage
17
Abstract
Pulsed laser deposition is a powerful technique to prepare not only superconductor films, but also a great variety of materials with enormous potential in electronic devices. In particular, it is the most suitable technique to grow oxide thin films, allowing an easy and reproducible way to prepare epitaxial films of complex stoichiometries. Recently, important progress has been produced on oxides with a wide range of functional properties: dielectric, conductor, superconductor, ferroelectric, optical, magnetic, and magnetoresistive. The success promises the future development of new microelectronics based on epitaxial oxides. In this paper, we present our results on pulsed laser deposition of dielectrics (yttria-stabilised zirconia, CeO2, SrTiO3), conductor (SrRuO3), ferroelectric (PbZr xTi1-xO3), and magnetoresistive (La2/3Sr1/3MnO3). Properties of epitaxial single layers and heterostructures are presented, with particular emphasis in the study and control of the crystal structure and the morphology. Films deposited on LaAlO3(001) and SrTiO 3(001) substrates are compared with those grown on technological Si(001). The possibilities of oxides in microelectronics are exemplified by Al/PbZrxTi1-xO3/SrRuO3 and YBa2Cu3O7/SrTiO3/La2/3 Sr1/3MnO3 heterostructures
Keywords
cerium compounds; colossal magnetoresistance; dielectric thin films; epitaxial layers; ferroelectric capacitors; ferroelectric thin films; lanthanum compounds; lead compounds; magnetic epitaxial layers; pulsed laser deposition; spin valves; strontium compounds; superconducting epitaxial layers; thin films; yttrium compounds; zirconium compounds; (LaSr)MnO/sub 3/; AFM; Al-PZT-SrRuO/sub 3/; Al-PbZrO3TiO3-SrRuO3; Al/PbZr/sub x/Ti/sub 1-x/O/sub 3//SrRuO/sub 3/; CeO/sub 2/; La/sub 2/3/Sr/sub 1/3/MnO/sub 3/; LaAlO/sub 3/; PZT; PbZr/sub x/Ti/sub 1-x/O/sub 3/; PbZrO3TiO3; SEM; SrRuO/sub 3/; SrTiO/sub 3/; TEM; XRD; YBa/sub 2/Cu/sub 3/O/sub 7/-SrTiO/sub 3/-(LaSr)MnO/sub 3/; YBa/sub 2/Cu/sub 3/O/sub 7//SrTiO/sub 3//La/sub 2/3/Sr/sub 1/3/MnO/sub 3/; ZrO/sub 2/Y/sub 2/O/sub 3/; capacitors; complex stoichiometry films; crystal structure control; dielectric films; epitaxial films; ferroelectric films; functional materials; heterostructures; magnetoresistive films; metallic oxide thin films; microelectronic applications; morphology control; pulsed laser deposition; spin injection devices; superconductor films; yttria-stabilised zirconia; Conducting materials; Dielectric thin films; Optical films; Optical pulses; Pulsed laser deposition; Sputtering; Superconducting epitaxial layers; Superconducting films; Superconducting materials; Superconducting thin films;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1999. CAS '99 Proceedings. 1999 International
Conference_Location
Sinaia, Romania
Print_ISBN
0-7803-5139-8
Type
conf
DOI
10.1109/SMICND.1999.810379
Filename
810379
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