DocumentCode :
3481700
Title :
Modification of silicon surface by direct laser interference
Author :
Dapeng Wang ; Zuobin Wang ; Ziang Zhang ; Yong Yue ; Dayou Li ; Maple, Carsten
Author_Institution :
JR3CN, Changchun Univ. of Sci. & Technol., Changchun, China
fYear :
2012
fDate :
Aug. 29 2012-Sept. 1 2012
Firstpage :
5
Lastpage :
8
Abstract :
Periodic and quasi-periodic structures on silicon surface have numerous significant applications in photoelectronics and surface engineering. A number of technologies have been developed to fabricate these structures in various research areas. In this work, we take the strategy of direct nanosecond laser interference patterning technology. Well-defined grating and dot structures have been achieved and interactive thermal effect was observed obviously. Additionally, the height and width of different structures were analyzed by AFM. It can be demonstrated that direct laser interference lithography is a promising technology which has the capability for the manufacturing of micro and nano structures.
Keywords :
atomic force microscopy; elemental semiconductors; laser materials processing; photolithography; silicon; surface structure; surface treatment; AFM; Si; direct laser interference lithography; direct nanosecond laser interference patterning technology; dot structures; grating structure; interactive thermal effect; microstructures; nanostructures; quasiperiodic structure; silicon surface modification; Gratings; Interference; Laser beams; Laser theory; Measurement by laser beam; Silicon; Direct laser interference patterning; micro and nano structures; thermal effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location :
Shaanxi
Print_ISBN :
978-1-4673-4588-0
Electronic_ISBN :
978-1-4673-4589-7
Type :
conf
DOI :
10.1109/3M-NANO.2012.6473000
Filename :
6473000
Link To Document :
بازگشت