Title :
Logical circuit gate sizing using MPSO guided by Logical Effort - an examination of the 12-stage ripple carry adder circuit
Author :
Johari, A. ; Salleh, M. K Mohd ; Halim, A.K. ; Yassin, I.M. ; Mohamed, S. ; Hassan, H.A.
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. Mara (UiTM), Shah Alam, Malaysia
Abstract :
Automated Complementary Metal Oxide Semiconductor (CMOS) logic circuit design leads to the reduction in costs associated with manpower and manufacturing time. Conventional methods use repetitive manual testing guided by Logical Effort (LE). LE provides an easy way to compare and select circuit topologies, choose the best number of stages for path and estimate path delay. In this paper, we propose the Mutative Particle Swarm Optimization (MPSO) algorithm as a method to automate the process of CMOS circuit design by approaching the design process as an optimization problem. In our work, we choose gate widths inside the circuit as parameters to be optimized in order to achieve the target delay, and its fitness is guided by the LE method. Various parameters, such as swarm size and iterations were tested under different initialization conditions to verify MPSO´s performance on a 12-stage ripple carry adder circuit. Results have indicated that the MPSO algorithm was an effective method to apply to the circuit design problem, with high convergence rates observed.
Keywords :
CMOS logic circuits; adders; carry logic; particle swarm optimisation; 12-stage ripple carry adder circuit; CMOS logic circuit design; MPSO; logical circuit gate sizing; logical effort; mutative particle swarm optimization algorithm; repetitive manual testing; Adders; CMOS integrated circuits; Delay; Logic gates; Optimization; Particle swarm optimization; Transistors; Automated circuit design; Logical Effort; Mutative Particle swarm optimization; Particle swarm optimization; ripple carry adder;
Conference_Titel :
Humanities, Science and Engineering (CHUSER), 2011 IEEE Colloquium on
Conference_Location :
Penang
Print_ISBN :
978-1-4673-0021-6
DOI :
10.1109/CHUSER.2011.6163765