• DocumentCode
    348199
  • Title

    Smooth 3-D shaping of thick resists by means of gray tone lithography

  • Author

    Dumbravescu, N.

  • Author_Institution
    Nat. Inst. for R&D in Microtechnol., Bucharest, Romania
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    217
  • Abstract
    This paper reports on the study of arbitrarily 3D shaping of negative and positive thick resists, using common technologies in standard IC fabrication. Particular emphasis is put on the design, manufacturing and use of half-tone transmission masks, required for UV-lithographic step in the fabrication process of mechanical, optical or electronics components. The original design and fabrication method, for so-called gray-tone reticles, were supported by experiments showing the main advantage of this new technology, the 3D structuring of thick resists in a single exposure step and also a high aspect ratio obtained of over 9:1. Experimental results are presented in SEM micrographs only for positive thick resists. Finally, by optimization of the lithographic process, interesting applications are shown
  • Keywords
    integrated circuit technology; photoresists; reticles; scanning electron microscopy; ultraviolet lithography; IC fabrication; SEM micrographs; UV-lithography; aspect ratio; gray tone lithography; gray-tone reticles; half-tone transmission masks; negative resists; positive resists; single exposure step; smooth 3D shaping; thick resists; Frequency; Lithography; Optical device fabrication; Optical devices; Optical diffraction; Optical filters; Pulse width modulation; Research and development; Resists; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1999. CAS '99 Proceedings. 1999 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-5139-8
  • Type

    conf

  • DOI
    10.1109/SMICND.1999.810501
  • Filename
    810501