DocumentCode
348199
Title
Smooth 3-D shaping of thick resists by means of gray tone lithography
Author
Dumbravescu, N.
Author_Institution
Nat. Inst. for R&D in Microtechnol., Bucharest, Romania
Volume
1
fYear
1999
fDate
1999
Firstpage
217
Abstract
This paper reports on the study of arbitrarily 3D shaping of negative and positive thick resists, using common technologies in standard IC fabrication. Particular emphasis is put on the design, manufacturing and use of half-tone transmission masks, required for UV-lithographic step in the fabrication process of mechanical, optical or electronics components. The original design and fabrication method, for so-called gray-tone reticles, were supported by experiments showing the main advantage of this new technology, the 3D structuring of thick resists in a single exposure step and also a high aspect ratio obtained of over 9:1. Experimental results are presented in SEM micrographs only for positive thick resists. Finally, by optimization of the lithographic process, interesting applications are shown
Keywords
integrated circuit technology; photoresists; reticles; scanning electron microscopy; ultraviolet lithography; IC fabrication; SEM micrographs; UV-lithography; aspect ratio; gray tone lithography; gray-tone reticles; half-tone transmission masks; negative resists; positive resists; single exposure step; smooth 3D shaping; thick resists; Frequency; Lithography; Optical device fabrication; Optical devices; Optical diffraction; Optical filters; Pulse width modulation; Research and development; Resists; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 1999. CAS '99 Proceedings. 1999 International
Conference_Location
Sinaia
Print_ISBN
0-7803-5139-8
Type
conf
DOI
10.1109/SMICND.1999.810501
Filename
810501
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