DocumentCode :
3482014
Title :
A multivariate system reliability estimation method based on step stress accelerated degradation testing
Author :
Hongliang Jia ; Miao Cai ; Daoguo Yang
Author_Institution :
Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear :
2013
fDate :
11-14 Aug. 2013
Firstpage :
1166
Lastpage :
1169
Abstract :
In this paper, a multivariate system reliability estimation method based on step stress accelerated degradation testing is proposed. Firstly, the method of step stress accelerated degradation testing (SSADT) is utilized to evaluate the reliability of LED luminaries. In the test, temperature is determined as the sensitive stress. Secondly, we suppose that all the performance metrics follow normal distribution and the variation of distribution parameters with time is employed to indicate the performance degradation. Arrhenius model is used to do the extrapolation. Thirdly, the correlation coefficients between different performance metrics are described as a Dunnett-Sobel class correlation matrix to consider the statistical dependence. At the same time, the dependent performance metrics are transformed to conditional-independent random variables. Then, the failure criteria are determined according to the standard from Energy Star. Subsequently, the system reliability is calculated based on total probability theorem and Monte Carlo simulation. At last, the system reliability of the LED luminaries considering lumen maintenance, CCT and color maintenance simultaneously is obtained.
Keywords :
Monte Carlo methods; light emitting diodes; matrix algebra; normal distribution; probability; reliability; Arrhenius model; Dunnett-Sobel class correlation matrix; Energy Star standard; LED luminaries reliability; Monte Carlo simulation; SSADT; conditional-independent random variables; correlation coefficients; dependent performance metrics; distribution parameters variation; extrapolation; failure criteria; multivariate system reliability estimation method; normal distribution; performance degradation; sensitive stress; statistical dependence; step stress accelerated degradation testing; total probability theorem; Degradation; Estimation; Light emitting diodes; Maintenance engineering; Measurement; Reliability; Stress; Dunnett-Sobel; LED luminaries; SSADT; multivarite system reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
Type :
conf
DOI :
10.1109/ICEPT.2013.6756666
Filename :
6756666
Link To Document :
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