DocumentCode
3482131
Title
A new imaging science phantom for performance evaluation of ultrasonic imaging systems
Author
Phillips, Daniel ; Parker, Kevin J.
Author_Institution
Dept. of Electr. Eng., Rochester Univ., NY, USA
Volume
2
fYear
1995
fDate
7-10 Nov 1995
Firstpage
1357
Abstract
We have developed a phantom manufactured with thin film techniques that enables precise placement of sub-resolvable “digital scatterers” on an acoustically transparent supporting medium within the scan plane of an ultrasound system. This technique permits formation of sophisticated test targets commonly used in imaging science. These phantoms can reveal the combined influence of all the stages in the imaging chain, as well as demonstrate imaging phenomenon that are difficult or not feasible to evaluate with conventional ultrasound phantoms. Use of half-tone mask techniques permit the specification of placement, pattern and statistical distribution of these “digital scatterers” necessary to produce images with definable gray scale characteristics. We have also been able to produce controlled stimulus sources for Doppler and color flow Doppler evaluation
Keywords
Doppler measurement; acoustic impedance; acoustic signal processing; biomedical equipment; biomedical ultrasonics; image resolution; medical image processing; performance evaluation; ultrasonic scattering; Doppler evaluation; acoustically transparent supporting medium; color flow Doppler evaluation; controlled stimulus sources; gray scale characteristics; half-tone mask techniques; imaging chain; imaging science phantom; pattern; performance evaluation; precise placement; scan plane; statistical distribution; sub-resolvable digital scatterers; test targets; thin film techniques; ultrasonic imaging systems; ultrasound system; Acoustic imaging; Acoustic scattering; Biomedical imaging; Imaging phantoms; Quality assurance; Sputtering; Substrates; Transistors; Ultrasonic imaging; Ultrasonic transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location
Seattle, WA
ISSN
1051-0117
Print_ISBN
0-7803-2940-6
Type
conf
DOI
10.1109/ULTSYM.1995.495808
Filename
495808
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