• DocumentCode
    3482564
  • Title

    Automation of direct josephson voltage standard comparison and an application

  • Author

    Tang, Y.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    4
  • Lastpage
    5
  • Abstract
    A direct Comparison between two Josephson Voltage Standard (JVS) systems has been used in the Bureau International des Poids et Mesures (BIPM) key comparisons or regional supplementary comparisons to verify the performance of a JVS with an uncertainty of few parts in 1010. Most direct JVS comparisons were manually operated. Hardware and protocol for an automatic direct JVS comparison have been developed to improve the efficiency while retaining the same level of uncertainty attained from a manual comparison. The automatic JVS direct comparison greatly improves the efficiency of data acquisition. A case study examining the offset related to digital voltmeter (DVM) polarity in an automatic direct JVS comparison is presented.
  • Keywords
    data acquisition; digital voltmeters; opto-isolators; superconductor-insulator-superconductor devices; Bureau International des Poids et Mesures; automatic direct JVS comparison; data acquisition; digital voltmeter polarity; direct Josephson voltage standard system automation; optoisolator; protocol; superconductor-insulator-superconductor Josephson junction array; Automation; Data acquisition; Electromagnetic interference; Electromagnetic measurements; Measurement standards; NIST; Protocols; Switches; Uncertainty; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5544581
  • Filename
    5544581