• DocumentCode
    3482582
  • Title

    Circular Blurred Shape Model for symbol spotting in documents

  • Author

    Escalera, Sergio ; Fornés, Alicia ; Pujol, Oriol ; Escudero, Alberto ; Radeva, Petia

  • Author_Institution
    Comput. Vision Center, UAB, Bellaterra, Spain
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    2005
  • Lastpage
    2008
  • Abstract
    Symbol spotting problem requires feature extraction strategies able to generalize from training samples and to localize the target object while discarding most part of the image. In the case of document analysis, symbol spotting techniques have to deal with a high variability of symbols´ appearance. In this paper, we propose the Circular Blurred Shape Model descriptor. Feature extraction is performed capturing the spatial arrangement of significant object characteristics in a correlogram structure. Shape information from objects is shared among correlogram regions, being tolerant to the irregular deformations. Descriptors are learnt using a cascade of classifiers and Abadoost as the base classifier. Finally, symbol spotting is performed by means of a windowing strategy using the learnt cascade over plan and old musical score documents. Spotting and multi-class categorization results show better performance comparing with the state-of-the-art descriptors.
  • Keywords
    document image processing; feature extraction; image restoration; Abadoost; circular blurred shape model; correlogram structure; document analysis; documents symbol spotting; feature extraction strategy; multiclass categorization; musical score documents; shape information; state-of-the-art descriptors; symbol spotting techniques; windowing strategy; Computer science; Computer vision; Feature extraction; Graphics; Image analysis; Image recognition; Pattern recognition; Shape; Text analysis; Text recognition; Document Image Processing; Image Shape Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5413811
  • Filename
    5413811