DocumentCode :
3482695
Title :
Photoinduced micron scale maskless etching in transparent glasses
Author :
Sauvain, E. ; Kyung, J.H. ; Lawandy, N.M.
Author_Institution :
Brown Univ., Providence, RI, USA
Volume :
2
fYear :
1994
fDate :
31 Oct-3 Nov 1994
Firstpage :
137
Abstract :
In this work we present the results of a new micron-scale maskless photoetching process which is applicable to a large variety of silica-based transparent glasses. The technique uses multiphoton absorption at 532 nm from a mode-locked Q-switched Nd:YAG laser to write the patterns directly onto the glass. The glass was exposed, to a solid Gaussian beam focused to about 70 μm at the glass surface, resulting in intensities of few GW/cm2, for periods of several tens of seconds and then etched in a 12% HF solution for fifteen minutes. The glasses were studied using contact atomic force microscopy (AFM) to determine the topography of the selectively etched patterns
Keywords :
laser beam effects; 532 nm; HF; HF solution; YAG:Nd; YAl5O12:Nd; contact atomic force microscopy; glass surface; micron-scale maskless photoetching process; mode-locked Q-switched Nd:YAG laser; multiphoton absorption; photoinduced micron scale maskless etching; selectively etched pattern topography measurement; silica-based transparent glasses; solid Gaussian beam focusing; transparent glasses; Absorption; Atomic force microscopy; Etching; Focusing; Glass; Hafnium; Laser beams; Laser mode locking; Solids; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1470-0
Type :
conf
DOI :
10.1109/LEOS.1994.586361
Filename :
586361
Link To Document :
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