• DocumentCode
    3482778
  • Title

    Optical methods for extreme level measurement

  • Author

    Drexler, P. ; Jirku, T. ; Steinbauer, M. ; Fiala, P.

  • Author_Institution
    Brno Univ. of Technol., Brno
  • fYear
    2007
  • fDate
    4-8 June 2007
  • Firstpage
    131
  • Lastpage
    135
  • Abstract
    There are certain optical methods for the measurement of ultra-short solitary electromagnetic pulses or low-level measurement. The measurement methods properties have to correspond to the fact of whether we want to measure pulses of voltage, current or a free-space electromagnetic wave. The need for specific measurement methods occurred owing to the development of high power microwave pulse generator. Certain applicable methods are presented in this paper. For the same purpose, the magneto-optic method can be utilized with respect to its advantages. For the measurement of the output microwave pulse of the generator, the optical method was designed and realized. Low-level optical measurement methods were used for nano-layers measurement and experimentally verified with regard to air ion concentration test.
  • Keywords
    electromagnetic pulse; microwave devices; pulse generators; pulse measurement; extreme level measurement; free-space electromagnetic wave; high power microwave pulse generator; optical methods; ultra-short solitary electromagnetic pulses; Current measurement; EMP radiation effects; Electromagnetic measurements; Level measurement; Microwave measurements; Microwave theory and techniques; Optical pulse generation; Optical pulses; Pulse measurements; Ultraviolet sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Waveform Diversity and Design Conference, 2007. International
  • Conference_Location
    Pisa
  • Print_ISBN
    978-1-4244-1276-1
  • Electronic_ISBN
    978-1-4244-1276-1
  • Type

    conf

  • DOI
    10.1109/WDDC.2007.4339395
  • Filename
    4339395