DocumentCode
3482778
Title
Optical methods for extreme level measurement
Author
Drexler, P. ; Jirku, T. ; Steinbauer, M. ; Fiala, P.
Author_Institution
Brno Univ. of Technol., Brno
fYear
2007
fDate
4-8 June 2007
Firstpage
131
Lastpage
135
Abstract
There are certain optical methods for the measurement of ultra-short solitary electromagnetic pulses or low-level measurement. The measurement methods properties have to correspond to the fact of whether we want to measure pulses of voltage, current or a free-space electromagnetic wave. The need for specific measurement methods occurred owing to the development of high power microwave pulse generator. Certain applicable methods are presented in this paper. For the same purpose, the magneto-optic method can be utilized with respect to its advantages. For the measurement of the output microwave pulse of the generator, the optical method was designed and realized. Low-level optical measurement methods were used for nano-layers measurement and experimentally verified with regard to air ion concentration test.
Keywords
electromagnetic pulse; microwave devices; pulse generators; pulse measurement; extreme level measurement; free-space electromagnetic wave; high power microwave pulse generator; optical methods; ultra-short solitary electromagnetic pulses; Current measurement; EMP radiation effects; Electromagnetic measurements; Level measurement; Microwave measurements; Microwave theory and techniques; Optical pulse generation; Optical pulses; Pulse measurements; Ultraviolet sources;
fLanguage
English
Publisher
ieee
Conference_Titel
Waveform Diversity and Design Conference, 2007. International
Conference_Location
Pisa
Print_ISBN
978-1-4244-1276-1
Electronic_ISBN
978-1-4244-1276-1
Type
conf
DOI
10.1109/WDDC.2007.4339395
Filename
4339395
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