Title :
Improvement of beam divergence by emission profiles with better homogeneity
Author :
Hoppe, P. ; Desjarlais, Michael P. ; Bluhm, H. ; Buth, L. ; Rusch, D. ; Stoltz, O. ; Vath, W.
Author_Institution :
Inst. fur Neutronenphys. und Reaktortech., Forschungszentrum Karlsruhe, Germany
Abstract :
Ion beam divergence is influenced by the emission profile of the beam; inhomogeneities can stimulate the transition from the stabilizing diocrotron mode to the detrimental high divergence ion mode. Applied fields for homogeneous beam emission profiles, which differed in strength and tilt, were designed for the KALIF Bappl diode. Experiments were performed on KALIF with these fields. They resulted in the lowest divergences ever measured with this diode. This proves, that the beam emission profile is a controllable key variable to improve the focusing properties of the beam
Keywords :
current density; ion sources; KALIF Bappl diode; beam divergence; beam emission profile; detrimental high divergence ion mode; emission profiles; focusing properties; inhomogeneities; ion beam divergence; stabilizing diocrotron mode; Acceleration; Coils; Current density; Diodes; Feeds; Frequency; Ion beams; Magnetic fields; Particle beams; Voltage;
Conference_Titel :
High-Power Particle Beams, 1998. BEAMS '98. Proceedings of the 12th International Conference on
Conference_Location :
Haifa
Print_ISBN :
0-7803-4287-9
DOI :
10.1109/BEAMS.1998.817003
