DocumentCode :
3483072
Title :
Performance and lifetime of the extended life ion source
Author :
Horsky, Tom ; Chen, Jiong ; Rutishauser, Hans ; Sinclair, Frank ; McIntyre, Ted ; Reynolds, Bill ; Cloutier, Richard ; Trueira, Frank ; Loizides, B. ; Bintz, Bill ; Neroda, Jim ; Grant, John ; Wilson, Shaun
Author_Institution :
Semicond. Equipment Oper., Eaton Corp., Beverly, MA, USA
fYear :
1996
fDate :
16-21 Jun 1996
Firstpage :
414
Lastpage :
417
Abstract :
Modern well engineering processes have extended the energy range of ion implant to several MeV. This extended energy range can only be accommodated by commercial high energy implanters which utilize multiply-charged ion species. We present performance and lifetime data from a new ion source which features an indirectly-heated cathode immersed in the plasma of a conventional reflex-geometry arc discharge chamber. The Extended Life Source (ELS) demonstrates improved multiply-charged ion production efficiency, enabling high energy ion implantation at increased beam currents while at the same time extending production-worthy lifetime for both high energy and high-current implanters. Field data shows that the ELS increases PM intervals for most processes while increasing throughput, providing a significant reduction in tool cost of ownership
Keywords :
arcs (electric); cathodes; ion implantation; ion sources; beam currents; commercial high energy implanters; extended energy range; extended life ion source; high-energy ion implantation; indirectly-heated cathode; lifetime data; multiply-charged ion species; reflex-geometry arc discharge chamber; Arc discharges; Cathodes; Implants; Ion implantation; Ion sources; Plasma applications; Plasma immersion ion implantation; Plasma sources; Power engineering and energy; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology. Proceedings of the 11th International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3289-X
Type :
conf
DOI :
10.1109/IIT.1996.586380
Filename :
586380
Link To Document :
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